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Last April 28, our colleague Valentin Genuer presented Phasics Advanced Wavefront Error and MTF Metrology Solutions during an OIDA Technology Showcase.

He introduced PHASICS wavefront sensing solutions applied to optics metrology challenges for exciting applications (AR/VR, Space, Defense, ADAS, LIDARs, ...). Phasics can support metrology projects with its pioneering and latest solutions from standalone wavefront sensors to fully integrated test stations, including our new versatile modular solution.

He emphasized on two main products associated with specific issues you may face:

• it becomes difficult to characterize small complex optics with high CRA (Chief Ray Angle) that are used for example in smartphones. Phasics has a solution for that with Kaleo MTF. Learn more here.
• Each metrology solution has specific requirements, but these requirements change with each project. The solution is Kaleo Kit which relies on the combination of interchangeable modules (SID4 wavefront sensors, R-cube illumination modules, and beam shapers), allowing the user to assemble his own cost-effective metrology system. Learn more here.

The replay of this presentaton is available. Don't hesitate to check it out: