Measure optics & systems at their design wavelength

Wavefront error metrology of coated optics at their design wavelength: your wavelength is our standard!

Whether they have a spectral coating or simple anti-reflective or high-reflectance coatings, most of the optical components are made to work in a specific spectral range. Optical performances and specifications should thus be given in the spectral range those optics have been designed for. Get rid of the 633 nm laser interferometry tyranny, and trust Phasics for a wavefront error metrology that makes sense! Your wavelength is our standard. All of our wavefront sensors and metrology machines are based on our patented Quadriwave Lateral Shearing Interferometry technology which provides truly achromatic transmitted and reflected wavefront error measurements.

• ▽ Transmitted Wavefront Error (TWE) measurement setups

  

  Depending on the component under test and the metrology requirements, transmitted wavefront error (TWE) measurement can be performed in single or double pass configuration. Phasics' solutions are diverse: fully integrated machine, modular solution developed by Phasics' engineers or standalone SID4 wavefront sensor you integrate in your own test system. Phasics's wavefront sensing technology is achromatic and compatible with a large range of sources: lasers, LEDs, tunable lasers, black bodies. This allows the metrological tests to be performed in conditions as close as possible to the working conditions of the optics or systems under test. 

• ▽ Reflected Wavefront Error (RWE) measurement setups

  

  For reflected wavefront error (RWE) measurements, Phasics proposes integrated test benches and machines as well as accessories such as the R-Cube illumination module. The choice of the illumination source is flexible and allows matching the coating specificities.

• ▽ Off-axis setups

  

  Based on the same principle as described above, wavefront error measurement can be performed off-axis