Material inspection

Optical waveguides, surfaces, and coatings metrology

Phasics' wavefront sensors and quantitative phase imaging cameras are compact, not sensitive to vibrations, and can be integrated with any optical microscope. This makes SID4 the ideal tool to perform on-line and off-line material qualification such as mapping the change of refractive index in transparent materials, laser-induced damage threshold monitoring, optical surface topography measurements, and photothermal imaging on nanoparticles. A broad range of samples can be measured including femtosecond laser-inscribed waveguides, fiber Bragg gratings, micro-structured optical surfaces, optical coatings, nanoparticles…