Optics & Optical Systems Metrology

Solutions for optical components and systems qualification: modulation transfer function (MTF), wavefront aberrations, surface measurement ...

Phasics offers a full range of metrology tools for optics quality control, optical system alignment, and surface measurement dedicated to both production and R&D environments. Phasics' metrology instruments span from the stand-alone wavefront sensor to the automated test station. Solutions are available from UV to far IR and perform comprehensive measurements while staying easy-to-use and versatile metrology instruments. Measured parameters include: modulation transfer function (MTF) wavefront aberrations, surface form, and surface quality.

Lens & assembly testing

Optical system alignment

Testing at the designed wavelength

Kaleo MTF with sample holder open. Qualification of large FOV large CRA lenses

Quality control of large field-of-view lenses

Filters and polarizing optics metrology

Metasurfaces and metaoptics qualification with SID4 sC8 wavefront sensor integrated on an optical microscope

Metalenses and metasurfaces qualification

Surface topography measurement

a vacuum chamber a SID4 HR wavefront sensor and R-cube illumination module illuminating performing TVAC wavefront testing

Environmental testing (TVAC)

Advantages

Flexibility of the test configuration

Single pass or double pass
On axis or in the field
Any source laser, LED, black body

Single-shot complete acquisition

Wavefront and aberrations
MTF (any direction, through focus)
Parameters (EFL, F/#, NA, PSF)

Broad range of solutions

UV, visible, NIR, SWIR, MWIR, LWIR
Standalone wavefront sensors
Fully automated test station

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