Material Inspection

Optical waveguides, surfaces, and coatings metrology

Phasics' wavefront sensors and quantitative phase imaging cameras are compact, not sensitive to vibrations, and can be integrated with any optical microscope. This makes SID4 the ideal tool to perform on-line and off-line material qualification such as mapping the change of refractive index in transparent materials, laser-induced damage threshold monitoring, optical surface topography measurements, and photothermal imaging on nanoparticles. A broad range of samples can be measured including femtosecond laser-inscribed waveguides, fiber Bragg gratings, micro-structured optical surfaces, optical coatings, nanoparticles …

Surface measurement with SID4 sC8 quantitative phase imaging camera integrated on an optical microscope

3D surface topography measurements

$Index of refraction mapping with SID4 sC8 quantitative phase imaging camera integrated on an optical microscope$

Optical waveguides metrology & index of refraction mapping

Photothermal imaging with SID4 sC8 quantitative phase imaging camera integrated on an optical microscope

Nanoplasmonics and photothermal imaging

Laser induced damage threshold measurement setup with SID4-HR wavefront sensor imaging a coated surface irradiated by a laser

Laser-Induced Damage Threshold (LIDT) monitoring

Advantages

Insightful measurements

Optical path differences (OPD)
Changes of index of refraction
Surface topography

Seamless integration

Plug and play camera-like instrument
Compatible with any microscope
No need for specific objectives

Powerful capabilities

2D OPD maps in a single acquisition
Sub-nanometer sensitivity
Insensitive to vibrations